ADVANCED ELECTRON MICROSCOPIC STUDY ON FEW LAYERED BLACK PHOSPHORUS

Author (s) : S.Komathi, K.S.Balaji, K.Sasikala, P.Vijayalakshmi

---

Abstract :
Advanced electron microscopic study for the two dimensional Black phosphorus (BP) is presented. Black phosphorus is a layered allotrope of bulk phosphorus, and can be exfoliated similarly to graphite to few layers while getting an intrinsic band gap compared to graphene. As this is an emerging field, full characterization of BP is necessary for research applications. Yet there is lack of full characterization for BP in recent work. Electron energy loss spectroscopy (EELS) is an advanced technique to analyze the chemical composition and bonding information of materials. In the present study, High Resolution Transmission Electron Microscope (HRTEM) combined with EELS and Energy Dispersive X-ray spectrometer (EDX) were used to characterize few layered BP. BP was exfoliated in different organic solvents in an inert environment. DMSO, DMF, DMAC, and ethanol were used as organic solvents. The morphological analysis, diffraction pattern analysis, and EELS study were carried out for layered BP. Further Raman spectroscopy was used to study the layered nature of BP. With the diffraction data it confirms DMSO is the best solvent for the exfoliation of BP to few layers.

Keywords : high resolution transmission electron microscopy, electron energy loss spectroscopy, black

Conference Date : 13/11/2020

Pages : 64

Paper ID : 20064